Tonghui TH510 Series Semiconductor C-V Characteristic Analyzer
Tonghui TH510 Series Datasheet
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Tonghui TH510 Series Features
- Frequency 1kHz-2MHz
- 10.1-inch capacitive touch screen, resolution 1280*800, Linux system
- Dual CPU architecture, the fastest test speed of LCR function is 0.56ms
- Three test methods: spot test, list scan, and graphic scan (option)
- Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen
- CV curve scan, Ciss-Rg curve scan
- Integrated design: LCR + VGS low voltage source + VDS high voltage source + channel switching + PC
- Standard 2-channel test, which can test two devices or dual-chip devices at the same time, the channel can be expanded to 6, channel parameters are stored separately
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Applications
Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
Semiconductor material Wafer, C-V characteristic analysis
Liquid crystal material Elastic constant analysis
Capacitive element : Capacitor C-V characteristic test and analysis, capacitive sensor test and analysis
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